53.083.1 CLASSIFICATION AND ANALYSIS OF LEVEL MEASUREMENT METHODS: 1Mahmudjonov M.M., 2Muminov Kh.D., 3Tilavkhanova L.R.

53.083.1 CLASSIFICATION AND ANALYSIS OF LEVEL MEASUREMENT METHODS

1Mahmudjonov M.M., 2Muminov Kh.D., 3Tilavkhanova L.R.

Авторы

  • Mirolim Mahmudjonov metrology, metrological support, measurement, measuring instruments, standardization and confirmation of conformity
  • Xolmurod Muminov Tashkent State Technical University
  • Tilavkhanova L.R. Tashkent State Technical University

DOI:

https://doi.org/10.61151/stjniet.v10i2.722

Ключевые слова:

Level measurement, level sensors, radio wave level sensors, acoustic and ultrasonic level sensors, hydrostatic level sensors, radioisotope level sensors, factors affecting level sensor accuracy

Аннотация

This article presents the classification of level measuring instruments and level sensors used as their sensitive elements. It describes the operating principles of electromechanical, electrical, optoelectronic, radio wave, acoustic and ultrasonic, hydrostatic, and radioisotope level sensors, providing examples of these devices. The advantages and disadvantages of using these sensors are also discussed. Additionally, the article analyzes the accuracy indicators of level measuring instruments and the factors influencing the results obtained from them

Биографии авторов

Xolmurod Muminov , Tashkent State Technical University

Assistant, Department of "Metrology, Technical Regulation, Standardization and Certification," Tashkent State Technical University

Tilavkhanova L.R., Tashkent State Technical University

Master's student, Department of "Metrology, Technical Regulation, Standardization and Certification," Tashkent State Technical University

Загрузки

Опубликован

2025-06-30

Как цитировать

Mahmudjonov, M., Muminov , X., & Tilavkhanova L.R. (2025). 53.083.1 CLASSIFICATION AND ANALYSIS OF LEVEL MEASUREMENT METHODS: 1Mahmudjonov M.M., 2Muminov Kh.D., 3Tilavkhanova L.R. Scientific and Technical Journal of Namangan Institute of Engineering and Technology, 10(2), 219–225. https://doi.org/10.61151/stjniet.v10i2.722
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